Ripple
Interferometry Software For
Optical Testing

Ripple is a powerful, device-independent software application designed for seamless interferometry data acquisition and analysis. Whether you're capturing interferograms directly from your interferometer or importing data from a variety of popular file formats, Ripple delivers robust tools to meet your precision optical metrology needs. With advanced features like phase unwrapping for noisy data, versatile masking capabilities, and comprehensive analysis tools—including Zernike polynomials, ISO 10110-5 specifications, and Fourier analysis—Ripple ensures accurate, flexible, and efficient results. Its compatibility with virtually any camera or interferometer, along with its intuitive interface, makes it the ideal solution for professionals in optics and beyond.
​Features (Ripple Brochure)
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Interferograms
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Single frame fringe carrier
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Phase Shifted (3-13 interferograms)
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Gaussian and median filtering
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Quality control during data acquisition
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Use with virtually any camera or interferometer
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Import from various popular file formats
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OPD
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Robust unwrapping of noisy data
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Gaussian, median, spike, Fourier filtering
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Averaging
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Reference subtraction
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​Multiple Surfaces/Cavities
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Multiple Surfaces/Cavities in a single measurement
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Homogentrity/Thickness variation
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Manual (mouse or numeric entry)
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Automatic
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​Masking
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Any number of apertures and obscurations
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Circle, ellipse, square, rectangle, polygon, annulus
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Manual (mouse or numeric entry)
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Automatic
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Reports
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Peak to Valley (PV)
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RMS
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Polynomial fitting
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Seidels
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Zernike's (unit circle, ellipse)
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XY polynomial (any shape)​​
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Cylinder, Twist, Power
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ISO 10110-5 Specification
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Slope (horizontal, vertical, magnitude)
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Units
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Display height in user selected units
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Calibrate and display xy axes in user selected units
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Display
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2D Color Map
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3D Surface
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Cross Sections
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Histograms
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Bar charts of numeric lists
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Multiple Documents Simultaneously
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Plugin Modules
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Angle Measurements
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Wedge
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Prisms
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Corner Cubes
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Optics Plugin 1
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​Diamond Tool Offset
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Radius of Curvature (ROC)
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Optics Plugin 2
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Homogeneity
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Absolute three flat test
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​Absolute Sphere Test
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Fourier Analysis
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Power Spectral Density (PSD)
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Point Spread Function (PSF)
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Modulation Transfer Function (MTF)
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Multi-Surface Measurements
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Multiple surfaces in single measurement
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Front/back surfaces​
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Thickness variation
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Optical Homogeneity
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File I/O
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Zygo Metro PRO
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ZEMAX​​
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CODEV
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IntelliWave
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RAW
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ASCII
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​Interferometers Supported
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Virtually any laser based or wavelength tuning interferometer is supported including Zygo, Wyko, PhaseShift Technologies/ADE, ESDI / IntelliWave, and custom systems.







Fringe Carrier Phase Shifting
Multi Surface/Cavity Measurements
2D/3D Display with complex masking
Diffration Analysis (MTF/PSF/Encircled Energy
​NEW IN RELEASE 2.0
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Wavelength tuning plus unique algorithms for multi-surface measurements including front/back surfaces, thickness variation, and optical homogeneity in a single measurement.
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Customizable phase-algorithms to match your optical geometry.
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User definable phase-algorithms for custom applications.
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NEW IN RELEASE 1.3
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PSD Filtering (Low Pass, High Pass, Band Pass, Band Reject)
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Geometric Image Transforms: perform wavefront operations on data sets in different coordinate systems
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New Multi-Document View for viewing many data sets simultaneously .
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Annulus shaped apertures/obscurations in addition to (circle, ellipse, rectangle, polygon).
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NEW IN RELEASE 1.2
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Angle measurements for ROC, Optical Wedge, Prism angle error, Corner cube dihedral angle error
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Power Spectral Density (PSD), Point Spread Function (PSF), Modulation Transfer Function (MTF)
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Scripting Language for automating complex repetitive tasks
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Export to Zygo DAT, ZEMAX, CODEV, RAW, IntelliWave
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Support for even more USB, GigE, and composite video cameras
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ALSO AVAILABLE AS AN SDK FOR INDEPENDANT SOFTWARE PRODUCT DEVELOPERS
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Contact
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Contact: Email us at rjc@rjcb-consulting.com or use the contact form below to request additional information and a downloadable evaluation program.